April marked the return of the Embedded Open-Source Summit, this year in Seattle. I was lucky enough to be able to attend and split my time between the Memfault booth in the exposition hall and many of the captivating presentations. Since the videos have just been published on the the Linux Foundation’s YouTube account, we thought it would be a good time to highlight some of the talks and give you a quick summary which will, hopefully, inspire you to go watch them!

Earlier this month, I had the pleasure of traveling to Nuremberg, Germany to attend Embedded World. If you have not heard about it before, Embedded World1 is the largest trade show in the embedded systems industry. This year, over 35,000 people attended and 1,100 businesses exhibited at the Nuremberg Messe.

In the previous articles, we covered Devicetree in great detail: We’ve seen how we can create our own nodes, we’ve seen the supported property types, we know what bindings are, and we’ve seen how to access the Devicetree using Zephyr’s devicetree.h API. In this fifth article of the Practical Zephyr series, we’ll look at how Devicetree is used in practice by dissecting the Blinky application.

In the previous article of this series, we briefly touched on how.bsd files written in Boundary Scan Description Language (BSDL) describe the structure of the boundary scan chain and the instruction set. In this article, we will examine this language’s syntax more closely before seeing how.bsd files are leveraged in JTAG testing in the next article.

In the third installment of this JTAG deep dive series, we will talk in-depth about JTAG Boundary-Scan, a method used to test interconnects on PCBs and internal IC sub-blocks. It is defined in the IEEE 1149.1 standard. I recommend reading Part 1 & Part 2 of the series to get a good background on debugging with JTAG before jumping into this one!